Electronic Magnetic Industry Co.
EMIC Image Processing Magnetic Particle Detector

Manufacturer: Electronic Magnetic Industry Co., Ltd.
Model: Image Processing Automatic Magnetic Particle Flaw Detector
Features
- The magnetization method is a multi-alternate magnetization method, which can detect defects in all directions in one magnetization operation.
- Depending on the shape of the test object, the magnetization method and transport mechanism will be individually corresponded.
- By incorporating magnetic particle concentration control devices into the system, it frees the operator from tedious tasks such as controlling and replenishing
magnetic particle concentrations. - Equipped with a high-sensitivity CCD camera, combined with the latest image processing software,
high-speed real-time inspection is now possible.
Specifications
1. Image processing equipment
OS | Windows 10 (PC-based) | |
monitor | 1366×768 or more | |
Camera Connection | 1~4 units | |
Image processing content | Masking, defect determination, and length indication |
2. Image input section
camera | High-sensitivity 3CCD camera (640×480 pixels) | |
lens | C-mount lenses |
3. Light source
name | UV flaw detector lamp | UV LEDs |
Lighting method | High frequency lighting method | Pulse lighting system |
Center wavelength | 365nm | 365nm |
4. Inspection fluid tank
Tank capacity | 150L (Decision to Match) | |
Stirring method | with pump motorcirculating |
5. Magnetization method
method | Multiple alternating magnetization method. | |
Magnetized power supply | Constant current control | |
Magnetization Current | AC、DC、100A~3,000A | |
Current Settings | Preset Formula |
6. Test fluid management
method | with automatic magnetic particle supply mechanism for concentration management |
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