EMIC Image Processing Magnetic Particle Detector

Manufacturer: Electronic Magnetic Industry Co., Ltd.
Model: Image Processing Automatic Magnetic Particle Flaw Detector

Features

  • The magnetization method is a multi-alternate magnetization method, which can detect defects in all directions in one magnetization operation.
  • Depending on the shape of the test object, the magnetization method and transport mechanism will be individually corresponded.
  • By incorporating magnetic particle concentration control devices into the system, it frees the operator from tedious tasks such as controlling and replenishing
    magnetic particle concentrations.
  • Equipped with a high-sensitivity CCD camera, combined with the latest image processing software,
    high-speed real-time inspection is now possible.

Specifications

1. Image processing equipment

OSWindows 10 (PC-based)
monitor1366×768 or more
Camera Connection1~4 units
Image processing contentMasking, defect determination, and length indication

2. Image input section

cameraHigh-sensitivity 3CCD camera (640×480 pixels)
lensC-mount lenses

3. Light source

nameUV flaw detector lampUV LEDs
Lighting methodHigh frequency lighting methodPulse lighting system
Center wavelength365nm365nm

4. Inspection fluid tank

Tank capacity150L (Decision to Match)
Stirring methodwith pump motorcirculating

5. Magnetization method

methodMultiple alternating magnetization method.
Magnetized power supplyConstant current control
Magnetization CurrentAC、DC、100A~3,000A
Current SettingsPreset Formula

6. Test fluid management

methodwith automatic magnetic particle supply mechanism for concentration management

 

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