Electronic Magnetic Industry Co.
EMIC XY Probe for flaw detection

Manufacturer: Electronic Magnetic Industry Co., Ltd.
Model: XY Probe
Features
XY Probe
It can detect vertical and horizontal defects at the same time.
Sensitivity has been greatly improved.
Related Products
-

EMIC Conveyor Type Through-Type Demagnetizer
-

EMIC Magnetic Particle Detector for Aircraft Parts Magnetic particle detector for aircraft parts
-

EMIC LCP-450, LCD-450, LCR-450 Staining Penetrant Detector
-

EMIC C-300 Flexible copper mesh
-

EMIC FY-500C Concentrated fluorescent magnetic powder solution
-

EMIC ET-5042 4-channel eddy current flaw detector





