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The features of the recognized sample can be measured, such as size, circularity, color, etc. By setting conditions for the sample features, the measurement points can be narrowed down.

Darkfield observation/MIX observation

Darkfield observation is effective for observing samples with color or fine irregularities. By using MIX observation, which combines the features of brightfield and darkfield observation, it becomes easier to observe samples that are difficult to see using one of the observation methods.

It is effective for observing buried objects and highly permeable samples.

 

Brightfield (left) and transmitted illumination (right) images of a plant stem

Polarized observation

It allows clear observation of the inner printed surface, which is difficult to see in bright field observation due to the effect of specular reflection from the film surface. Polarized light makes it easier to observe single crystals, minerals, and foreign matter in polymer films.

Differential interference observation

By using differential interference, minute irregularities in the sample are highlighted.

Combined analysis with infrared microscope

By using a sharing holder, it becomes possible to measure the same spot with an infrared microscope and a Raman microscope. Infrared analysis and Raman analysis are complementary, and by acquiring both spectra, it is possible to obtain information that is unique to each technique.

Reload Measurement

High-speed imaging QRI:Quick Raman Imaging

By using a high-speed, high-precision stage and high-speed data acquisition by the CCD detector, imaging of tens of thousands of points can be obtained in a few minutes. It can handle a wide range of sample sizes, from millimeter order to submicron order.

Tracking surface irregularities SSI: Surface Scan Imaging

For samples with unevenness or inclination, the stage is scanned in three dimensions based on the height information obtained from the all-in-focus image to measure the spectrum. No pretreatment is required even for samples with unevenness.

3D Imaging

Using a confocal optical system, Raman imaging is obtained in the depth direction of the sample. It is possible to measure each layer of a laminated film and buried foreign objects non-destructively and without contact.

Identification of unknown samples One click to search screen

It includes functions such as searching by spectrum, peak, and structure, multi-component search, and spectrum analysis support. In addition to these functions, it comes standard with a reference library of 645 organic compound spectra and 650 JASCO original spectra. In addition, a Raman database of approximately 25,000 compounds is available as an option.

Create “component distribution image” with simple operations

The built-in microscope imaging analysis program allows you to create chemical images with simple operations using peak height, area, half-width, correlation coefficient, multivariate analysis, etc. By using the analysis assistant function, anyone can easily pre-process data and create beautiful color-coded graphs by following the sequence and setting guide.