Japan, Jasco
Jasco FTIR 6X, FTIR 8X Fourier Transform Infrared Spectrophotometer (FTIR)
Made in Japan
Manufacturer: Jasco
Model: FTIR 6X, FTIR 8X
Line up
FT/IR-6X
FT/IR-8X
JASCO’s flagship model FTIR boasts a basic performance of S/N 55000:1 and a maximum resolution of 0.07 cm⁻¹. It supports rapid and step scan measurements, offering time resolution up to 10 nanoseconds. Compatible with vacuum housing, it also allows expansion of the measurement wavenumber.
Vacuum Measurement
The FT/IR-6X and 8X, when fitted with a vacuum-type housing, eliminate atmospheric effects more effectively than purging. This setup detects minute peaks and performs highly accurate measurements in the far infrared region, making it ideal for monitoring low-concentration gases below ppm and measuring thin films.
Step scan measurement
The FT/IR-8X supports step-scan measurements, useful for tracking transient phenomena like electric field orientation in liquid crystals. Additionally, it supports depth profile measurements using an infrared acoustic measurement device with phase modulation.
Interferometers that provide stable, highly accurate data
The interferometer, the core of the FTIR, uses a 28° incidence Michelson design to improve throughput and polarization characteristics. High-precision DSP control manages the moving mirror, maintaining a stable interference state with the help of a corner cube mirror as a retroreflection element.
Optics protected by a robust optical base
The interferometer mounts on a cast aluminum optical base with a robust rib structure, supported by seismic isolation legs, to protect it from vibration and distortion, ensuring stable long-term data. The highly sealed interferometer case safeguards the internal optical elements. The high-brightness, long-life ceramic light source, temperature-controlled DLATGS detector, and moisture-resistant KRS-5 window plate enable reliable long-term measurements.
Measurement wavenumber can be expanded from near infrared to far infrared
Replacing the light source, beam splitter, window plate, and detector expands the measurement wavenumber range from 25000 to 20 cm⁻¹. Using the automatic beam splitter replacement unit ensures reliable and safe beam splitter changes. The following data was measured by switching the light source and beam splitter.
Spectrum Manager Ver.2.5
Spectrum Manager Ver.2.5 maximizes the performance of the FT/IR-6X/8X, making measurements easy.
Navigation Features
Simply follow the navigation to set the measurement conditions that best suit your purpose.
Method Function
By registering frequently used measurement conditions as a method, you can easily perform measurements from the next time.
Registering with a method Method Selection
Specification
FT/IR-6X/8X
Model name | FT/IR-6X | FT/IR-8X |
|---|---|---|
| Measurement wave number range | 7800 to 350 cm −1 | |
| Extended measurement wavenumber range | 25000 to 20 cm −1 | |
| Highest resolution | 0.25 cm −1 | 0.07 cm −1 |
| Interferometer | 28° incidence Michelson interferometer Ge/KBr beam splitter (replaceable), corner cube mirror auto-alignment mechanism, DSP control, sealed type (KRS-5 window, window can be replaced as an option) | |
| Data Sampling Laser | Semiconductor laser | He-Ne laser |
| Vacuum sealed | option | |
| light source | High brightness ceramic light source | |
| Detector | DLATGS (with temperature control) | |
| Signal to noise ratio *1 | 47000:1 | 55000:1 |
| Rapid scan function *2 | option | |
| Step scan function *3 | – | option |
| Standard Program | Spectrum Manager Ver.2.5 | |
| Dimensions & Weight | Main unit: 600(W) x 690(D) x 315(H) mm, 56 kg | Main unit: 600(W) x 690(D) x 315(H) mm, 56 kg Power supply box: 85(W) x 260(D) x 197(H) mm, 4.7 kg |
*1 Measurement conditions: Resolution 4 cm -1 , integration time 1 min, near 2200 cm -1 , PP
*2 A separate MCT detector is required.
*3 Requires separate step-scan MCT detector
