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Vacuum Measurement

The FT/IR-6X and 8X, when fitted with a vacuum-type housing, eliminate atmospheric effects more effectively than purging. This setup detects minute peaks and performs highly accurate measurements in the far infrared region, making it ideal for monitoring low-concentration gases below ppm and measuring thin films.

Step scan measurement

The FT/IR-8X supports step-scan measurements, useful for tracking transient phenomena like electric field orientation in liquid crystals. Additionally, it supports depth profile measurements using an infrared acoustic measurement device with phase modulation.

Interferometers that provide stable, highly accurate data

The interferometer, the core of the FTIR, uses a 28° incidence Michelson design to improve throughput and polarization characteristics. High-precision DSP control manages the moving mirror, maintaining a stable interference state with the help of a corner cube mirror as a retroreflection element.

Optics protected by a robust optical base

The interferometer mounts on a cast aluminum optical base with a robust rib structure, supported by seismic isolation legs, to protect it from vibration and distortion, ensuring stable long-term data. The highly sealed interferometer case safeguards the internal optical elements. The high-brightness, long-life ceramic light source, temperature-controlled DLATGS detector, and moisture-resistant KRS-5 window plate enable reliable long-term measurements.

Measurement wavenumber can be expanded from near infrared to far infrared

Replacing the light source, beam splitter, window plate, and detector expands the measurement wavenumber range from 25000 to 20 cm⁻¹. Using the automatic beam splitter replacement unit ensures reliable and safe beam splitter changes. The following data was measured by switching the light source and beam splitter.

Spectrum Manager Ver.2.5

Spectrum Manager Ver.2.5 maximizes the performance of the FT/IR-6X/8X, making measurements easy.

Navigation Features

Simply follow the navigation to set the measurement conditions that best suit your purpose.