Product Made in Japan
Manufacturer: SANKO ELECTRONIC LABORATORY
Model: SWT-7000III, FN-325

Features

The new dual probe FN-325 with auto (intelligent ) setting provides you with easy and simple operation： The probe FN-325 can be used with SWT-7000 Ⅲ series (7000Ⅲ, 7100Ⅲ, 7200Ⅲ) for measurements of both Fe and NFe metal substrates.

Optional SWT probes are interchangeable.

• Dual type : FN-325
• For ferrous : Fe type
• For non-ferrous : NFe type
• The new FN-325 can not be used with SWT-7000, SWT-7000Ⅱ series but with SWT-7000Ⅲsereis only

Specification

Probe type  :  Dual FN-325 (exclusive for SWT-7000III series)
Measuring method  :  Electromagnetic/Eddy current dual use
Measuring range  :  Ferrous：0～3.00mm, Nonferrous：0～2.50mm
Substrate detection  :  Automatic or manual switching
Display resolutions  :  1μm：0～999μm
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm), (nonferrous 1.00～2.50mm）
Accuracy (place the probe perpendicularly :  Ferrous ＆nonferrous dual use to the flat face) 0～100μm：±1μｍ　or ±2％ the read value:（ferrous）101μm～3.00mm：±2％,（nonferrous）101μm～2.50mm：±2％
Probe  :  One point contact constant pressure type, with V cut φ13×52mm, 72g
Option  :  V type probe adaptors (3 types: less Φ5, Φ5～10, Φ10～20 )
Accessories  :  Calibration standards (plastic foils), Zero plate （ferrous, nonferrous dual）
Measuring objectives  :  Fe substrate: coating, lining, thermal spraying, plating on magnetic, metal like iron, steel (except electrolyte nickel plating).NFe substrate: insulated films on non-magnetic metal copper

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