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Vacuum Measurement

The FT/IR-6X and 8X, when fitted with a vacuum type housing, eliminate atmospheric effects more effectively than purging. This setup detects minute peaks and performs highly accurate measurements in the far infrared region, making it ideal for monitoring low concentration gases below ppm and measuring thin films.

Extremely low concentration water vapor spectrum (vacuum measurement)

Step scan measurement

The FT/IR-8X supports step-scan measurements, useful for tracking transient phenomena like electric field orientation in liquid crystals. Additionally, it supports depth profile measurements using an infrared acoustic measurement device with phase modulation.

Step-scan measurement of dynamic response of liquid crystals

Interferometers that provide stable, highly accurate data

The interferometer, the core of the FTIR, uses a 28° incidence Michelson design to improve throughput and polarization characteristics. High-precision DSP control manages the moving mirror, maintaining a stable interference state with the help of a corner cube mirror as a retroreflection element.

Corner Cube Mirror

Optics protected by a robust optical base

The interferometer mounts on a cast aluminum optical base with a robust rib structure, supported by seismic isolation legs, to protect it from vibration and distortion, ensuring stable long-term data. The highly sealed interferometer case safeguards the internal optical elements. The high-brightness, long-life ceramic light source, temperature-controlled DLATGS detector, and moisture-resistant KRS-5 window plate enable reliable long-term measurements.

   

Seismic isolation structure                                                  Moisture-resistant KRS-5 is used for the interferometer window plate.

Measurement wavenumber can be expanded from near infrared to far infrared

Replacing the light source, beam splitter, window plate, and detector expands the measurement wavenumber range from 25000 to 20 cm⁻¹. Using the automatic beam splitter replacement unit ensures reliable and safe beam splitter changes. The following data was measured by switching the light source and beam splitter.

   

Broadband measurement data (polystyrene)                      Automatic BS exchange unit

Spectrum Manager Ver.2.5

Spectrum Manager Ver.2.5 maximizes the performance of the FT/IR-6X/8X, making measurements easy.

Navigation Features

Simply follow the navigation to set the measurement conditions that best suit your purpose.

Method Function

By registering frequently used measurement conditions as a method, you can easily perform measurements from the next time.

Registering with a method                                                                    Method Selection

Specification

FT/IR-6X/8X

Model name	FT/IR-6X	FT/IR-8X
Measurement wave number range	7800 to 350 cm −1
Extended measurement wavenumber range	25000 to 20 cm −1
Highest resolution	0.25 cm −1	0.07 cm −1
Interferometer	28° incidence Michelson interferometer Ge/KBr beam splitter (replaceable), corner cube mirror auto-alignment mechanism, DSP control, sealed type (KRS-5 window, window can be replaced as an option)
Data Sampling Laser	Semiconductor laser	He-Ne laser
Vacuum sealed	option
light source	High brightness ceramic light source
Detector	DLATGS (with temperature control)
Signal to noise ratio *1	47000:1	55000:1
Rapid scan function *2	option
Step scan function *3	–	option
Standard Program	Spectrum Manager Ver.2.5
Dimensions & Weight	Main unit: 600(W) x 690(D) x 315(H) mm, 56 kg	Main unit: 600(W) x 690(D) x 315(H) mm, 56 kg Power supply box: 85(W) x 260(D) x 197(H) mm, 4.7 kg

*1 Measurement conditions: Resolution 4 cm ^-1 , integration time 1 min, near 2200 cm ^-1 , PP
*2 A separate MCT detector is required.
*3 Requires separate step-scan MCT detector