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Japan, SANKO ELECTRONIC LABORATORY
SANKO ELECTRONIC LABORATORY NFE Exclusive Probes For SWT Series Electro-magnetic / Eddy Current Coating Thickness Metters
Product Made in Japan
Manufacturer: SANKO ELECTRONIC LABORATORY
Model: NFE Series
Features
- Separate-interchangeable probes available with a main unit.
- Selections of probe for ferrous (electro-magnetic) or non-ferrous ( eddy current) substrate depending on a measuring object.
- Capability of selections probe like high-stable probe to measure minute piece objects or alike depending on applications and a measurement range.
Specification
Models |
NFe-2.0※1/2.0L |
Methods | Eddy current type |
Ranges | 0~2.00mm |
Display resolutions | 1μm:0~999μm switching to 0.1μm:0~400μm 0.5μm:400~500μm 0.01mm:1.00~2.00mm |
Accuracies (perpendicularly on flat face) | 0~100μm:±1μm or ±2% the read value 101μm~2.00mm:±2% |
Probes | One point contact constant pressure type, V cut 2.0:φ15×47mm 2.0L:18x22x57mm |
V type probe adaptor※2/Non | |
Accessories | Standard thickness, Zero plate for testing (NFe) |
Measuring objects |
Insulated films on non-Magnetic metal substrates like aluminum, cupper |
Relatively general use objects |
Probe must be ordered separately.
1.Probes are heat-resistant (about 200℃). (NFe-2.0)
2.V type probe adaptors (3 kinds:lessΦ5, Φ5~10, Φ10~20) can be used with NFe-2.0.
Models |
NFe-0.6 |
NFe-5 |
NFe-8 |
Methods | Eddy current type | ||
Ranges | 0~600μm | 0~5mm | 0~8mm |
Display resolutions |
1μm:0~600μm switching to 0.1μm:0~400μm 0.5μm:400~500μm |
1μm:0~999μm 0.01mm: 1~5mm |
1μm:0~999μm 0.01mm:1~8mm |
Accuracies (perpendicularly on flat face) |
0~100μm:±1μm or ±2% the read value 101μm~600μm:±2% |
0~3mm:±(5μm + ±3% the read value) Over or 3.01mm:±3% the read value |
0~3mm:±(5μm + ±3% the read value) Over or 3.01mm:±3% the read value |
Probes | One point contact constant pressure type, φ13×45.5mm |
One point contact constant pressure type, V cut φ20.4×47.1mm |
One point contact constant pressure type, V cut φ35×59mm |
Non | |||
Accessories | Standard thickness, Zero plate for testing (NFe) | ||
Measuring objects |
Insulated films on non-Magnetic metal substrates like aluminum, cupper | ||
like aluminum, cupper for high stability for narrow bar , tube, minute pieces | Relatively thick objects | Relatively thick objects |
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