Manufacturer: Shinko Seiki Co., Ltd.
Model: SF-IIC, SF-IIL, SF-II

Features

• Measurement is automated via color image processing, thus reducing inconsistencies in measured results.
• Measurement data and image data are easily recorded.
• Glass strain can be observed using a sensitive color plate.
• The image on this page is the newly developed SF-II ASSIST.
• SF-II ASSIST (* optional accessory) can support measurement simply by installing in the existing SF-II. It increases the number of positions that can be simultaneously processed to 10 points, which markedly shortens processing time .
• Also, SF-II ASSIST can automatically create test reports once measurement data has been saved.
• The test reports can be edited anytime with Microsoft® Word software.
• * SF-II ASSIST does not come with the SF-II unit. In addition to the software, a CCD camera, image capturing lens and PC are required to use SF-II ASSIST.

Specifications

• Measurement method: Senarmont method
• Measurement accuracy: 1.6 nm (Double refraction)
• Measurement range: 590 nm in primary interference
• Measurement view range: φ40 mm
• Camera view range: 2×, 4×, close-up mode
• Light source: 15 V, 150 W • halogen lamp (SF-IIC), 24 V, 48 W – LED (SF-IIL)